General discussion

[aai2k]

Anything related to this project can be discussed here.

[xluo3166-pixel]

软后续有没有考虑，导入实际的测试数据进行反演 。

[aai2k]

Is there any plan for the software to support importing actual measured data and doing inversion?

Hi. Yes, in 1.7.0.

An imported measured curve can be turned into a merit function target, so the optimizer fits a design's layer thicknesses to your own measurement.

There is also a new n,k Characterization window. It derives a film's index, extinction and thickness from a measured transmittance and reflectance pair, or from an ellipsometric Ψ and Δ pair, and saves the result as a material or as a design that reproduces the measurement.

If you have an ellipsometer, sample files are wanted in #66 so the reader handles your instrument's export as written.