Double Pulse Testing Plattform with Arduino Nano IoT33 for HybridPACK
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Updated
Mar 23, 2026
Double Pulse Testing Plattform with Arduino Nano IoT33 for HybridPACK
Characterization of AlGaN/GaN wide bandgap semiconductor heterostructures on SiC substrates using XRD, XPS, Photoluminescence, and temperature-dependent Raman spectroscopy to study structural, optical, and chemical properties for HEMT applications.
Supporting data for T. Reiter, M. Niendorf, J. Schapdick, "A Method for Individual Switching Energy Extraction in Si/SiC Fusion Switches", ECCE Europe, 2026 (planned publication)
MATLAB/Simulink models for evaluating control-dependent SiC active rectifier performance in ultra-low-voltage, high-current electrowinning power supplies.
PWM Dead Time Calculator
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